Accelerated Endurance Testing Suppliers
An accelerated endurance test structure and process that provides a wafer-level dielectric test. A wafer-level dielectric testing structure includes a heating element. The heating element may be poly-silicon or metal and is formed as a layer above a tunnel oxide layer of an integrated circuit (IC).
8568 Dewberry Way, Elk Grove, California 95624-1246, USA www.mechtronixeng.com
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Mechtronix Engineering is an engineering consultancy specializing in the design, development and testing of pumps and turbomachinery. We provide a wide variety of services ranging from new pump design more...